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The SPM NANOEDUCATOR II uses a principle similar to a semi-contact AFM, but it uses a different sensor, different from the classic one (see Fig. further sections "Types of sensors" and "Construction of SPM NANOEDUCATOR II").
Another feature of the SPM is the measurement of other signals from the sensors. Such signals, unlike the signal used in feedback, do not are kept constant during scanning, and their change reflects change in surface properties. Such methods can be called measuring. For example, MSM (magnetic force microscopy), CEM (scanning capacitive microscopy), modulation force microscopy, scanning near-field optical microscopy (SNOM) and the like.

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